IEEE - Institute of Electrical and Electronics Engineers, Inc. - Power switch characterization for fine-grained dynamic voltage scaling

2008 IEEE International Conference on Computer Design

Author(s): Liang Di ; M. Putic ; J. Lach ; B.H. Calhoun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Lake Tahoe, CA, USA
Conference Date: 12 October 2008
Page(s): 605 - 611
ISBN (CD): 978-1-4244-2658-4
ISBN (Paper): 978-1-4244-2657-7
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.2008.4751923
Regular:

Dynamic voltage scaling (DVS) provides power savings for systems with varying performance requirements. One low overhead implementation of DVS uses PMOS power switches to connect DVS blocks to one... View More

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