IEEE - Institute of Electrical and Electronics Engineers, Inc. - Acquiring an exhaustive, continuous and real-time trace from SoCs

2008 IEEE International Conference on Computer Design

Author(s): C. Hochberger ; A. Weiss
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Lake Tahoe, CA, USA
Conference Date: 12 October 2008
Page(s): 356 - 362
ISBN (CD): 978-1-4244-2658-4
ISBN (Paper): 978-1-4244-2657-7
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.2008.4751885
Regular:

The amount of time and resources that have to be spent on debugging of embedded cores continuously increases. Approaches valid 10 years ago can no longer be used due to the variety and complexity... View More

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