IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization and design of sequential circuit elements to combat soft error

2008 IEEE International Conference on Computer Design

Author(s): H. Abrishami ; S. Hatami ; M. Pedram
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Lake Tahoe, CA, USA
Conference Date: 12 October 2008
Page(s): 194 - 199
ISBN (CD): 978-1-4244-2658-4
ISBN (Paper): 978-1-4244-2657-7
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.2008.4751861
Regular:

This paper performs analysis and design of latches and flip-flops while considering the effect of event upsets caused by energetic particle hits. First it is shown that the conventional analysis... View More

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