IEEE - Institute of Electrical and Electronics Engineers, Inc. - Adaptive SRAM memory for low power and high yield

2008 IEEE International Conference on Computer Design

Author(s): B. Mohammad ; S. Bijansky ; A. Aziz ; J. Abraham
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Lake Tahoe, CA, USA
Conference Date: 12 October 2008
Page(s): 176 - 181
ISBN (CD): 978-1-4244-2658-4
ISBN (Paper): 978-1-4244-2657-7
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.2008.4751858
Regular:

SRAMs typically represent half of the area and more than half of the transistors on a chip today. Variability increases as feature size decreases, and the impact of variability is especially... View More

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