IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study of reliability issues in clock distribution networks

2008 IEEE International Conference on Computer Design

Author(s): A. Todri ; M. Marek-Sadowska
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Lake Tahoe, CA, USA
Conference Date: 12 October 2008
Page(s): 101 - 106
ISBN (CD): 978-1-4244-2658-4
ISBN (Paper): 978-1-4244-2657-7
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.2008.4751847
Regular:

In this paper, we present a reliability study of clock mesh distribution networks. We analyze the electromigration (EM) phenomena and demonstrate their occurrence in clock mesh networks (CMN). Due... View More

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