IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research of Reliability for Measuring High-g Micro Array Acceleration Sensor

2008 15th International Conference on Mechatronics and Machine Vision in Practice

Author(s): Liu Xiaoming ; Xie Mengji ; Zhu Zhonggan ; Wu Jianshu ; Cao Shijian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Auckland, New Zealand
Conference Date: 2 December 2008
Page(s): 423 - 428
ISBN (CD): 978-0-473-13532-4
ISBN (Paper): 978-1-4244-3779-5
DOI: 10.1109/MMVIP.2008.4749571
Regular:

High-g is the acceleration value, larger than 105 g. For the requirements of detecting high g, people pay more and more attention to the reliability of an accelerometer. In this paper,... View More

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