IEEE - Institute of Electrical and Electronics Engineers, Inc. - Machine vision for automated optical recognition and classification of pollen grains or other singulated microscopic objects

2008 15th International Conference on Mechatronics and Machine Vision in Practice

Author(s): G.P. Allen ; R.M. Hodgson ; S.R. Marsland ; J.R. Flenley
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Auckland, New Zealand
Conference Date: 2 December 2008
Page(s): 221 - 226
ISBN (CD): 978-0-473-13532-4
ISBN (Paper): 978-1-4244-3779-5
DOI: 10.1109/MMVIP.2008.4749537
Regular:

The location and identification of singulated objects on microscope slides is a problem that is common to many applications, including recognition of pollen. In this paper, we describe a working... View More

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