IEEE - Institute of Electrical and Electronics Engineers, Inc. - Surface Roughness Vision Measurement in Different Ambient Light Conditions

2008 15th International Conference on Mechatronics and Machine Vision in Practice

Author(s): Zhisheng Zhang ; Zixin Chen ; Jinfei Shi ; Fang Jia ; Min Dai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Auckland, New Zealand
Conference Date: 2 December 2008
Page(s): 1 - 4
ISBN (CD): 978-0-473-13532-4
ISBN (Paper): 978-1-4244-3779-5
DOI: 10.1109/MMVIP.2008.4749497
Regular:

Machine vision method was used to measure the surface roughness for different Phi38 mm grinding axes in different ambient light conditions. To analyze the effect of ambient light, a method based... View More

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