IEEE - Institute of Electrical and Electronics Engineers, Inc. - Target tracking using mean-shift and affine structure

ICPR 2008 19th International Conference on Pattern Recognition

Author(s): Chuan Zhao ; A. Knight ; I. Reid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Tampa, FL, USA
Conference Date: 8 December 2008
Page(s): 1 - 5
ISBN (CD): 978-1-4244-2175-6
ISBN (Paper): 978-1-4244-2174-9
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2008.4761914
Regular:

In this paper, we present a new approach for tracking targets with their size and shape time-varying, based on a combination of mean-shift and affine structure. Although the well-known mean-shift... View More

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