IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring skin reflectance parameters

ICPR 2008 19th International Conference on Pattern Recognition

Author(s): M.P. Dickens ; W.A.P. Smith ; H. Ragheb ; E.R. Hancock
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Tampa, FL, USA
Conference Date: 8 December 2008
Page(s): 1 - 4
ISBN (CD): 978-1-4244-2175-6
ISBN (Paper): 978-1-4244-2174-9
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2008.4761885
Regular:

This paper addresses the problem of determining skin reflectance parameters, and studies their stability and discriminating power for different individuals. Our study uses radiance data captured... View More

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