IEEE - Institute of Electrical and Electronics Engineers, Inc. - An optimized analytical electron mobility model based on genetic algorithm computation to study the GaN-based MOSFETs

2008 2nd International Conference on Signals, Circuits and Systems (SCS)

Author(s): M.A. Abdi ; F. Djeffal ; N. Lakhdar ; T. Bendib ; F. Meddour
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Monastir, Tunisia
Conference Date: 7 November 2008
Page(s): 1 - 3
ISBN (CD): 978-1-4244-2628-7
ISBN (Paper): 978-1-4244-2627-0
DOI: 10.1109/ICSCS.2008.4746943
Regular:

Recently, the evolutionary techniques, like genetic algorithms (GA), has attracted considerable attention among various heuristic optimization techniques. So, in this paper, a genetic algorithm is... View More

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