IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of machine learning techniques for context extraction

2008 Third International Conference on Digital Information Management

Author(s): M. Granitzer ; M. Kroll ; C. Seifert ; A.S. Rath ; N. Weber ; O. Dietzel ; S. Lindstaedt
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: London, UK
Conference Date: 13 November 2008
Page(s): 233 - 240
ISBN (CD): 978-1-4244-2917-2
ISBN (Paper): 978-1-4244-2916-5
DOI: 10.1109/ICDIM.2008.4746809
Regular:

dasiaContext is keypsila conveys the importance of capturing the digital environment of a knowledge worker. Knowing the userpsilas context offers various possibilities for support, like for... View More

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