IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bug reports retrieval using Self-organizing Map

2008 Third International Conference on Digital Information Management

Author(s): R.L.M.E. do Rego ; M. Ribeiro ; E. Aleixo ; R.M.C.R. de Souza
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: London, UK
Conference Date: 13 November 2008
Page(s): 320 - 325
ISBN (CD): 978-1-4244-2917-2
ISBN (Paper): 978-1-4244-2916-5
DOI: 10.1109/ICDIM.2008.4746786
Regular:

An important process when implementing complex software systems consist of documenting the bugs found in that software. However, since many developers are working at the same time on the project,... View More

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