IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning classifiers without negative examples: A reduction approach

2008 Third International Conference on Digital Information Management

Author(s): Dell Zhang ; Wee Sun Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: London, UK
Conference Date: 13 November 2008
Page(s): 638 - 643
ISBN (CD): 978-1-4244-2917-2
ISBN (Paper): 978-1-4244-2916-5
DOI: 10.1109/ICDIM.2008.4746761
Regular:

The problem of PU Learning, i.e., learning classifiers with positive and unlabelled examples (but not negative examples), is very important in information retrieval and data mining. We address... View More

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