IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on Peer Review and Multi-indicators Evaluation in Scientific and Technological Assessment

2008 International Symposium on Knowledge Acquisition and Modeling (KAM)

Author(s): Yu Liping ; Pan Yuntao ; Yang Chun ; Wu Yishan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Wuhan, China
Conference Date: 21 December 2008
Page(s): 794 - 798
ISBN (Paper): 978-0-7695-3488-6
DOI: 10.1109/KAM.2008.39
Regular:

This paper analyzes the relation between peer review and multi-indicators evaluation for scientific and technical assessment. Based on the data of the 2007 Times Higher-QS world university... View More

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