IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimal Cleaning Rule Selection Model Design Based on Machine Learning

2008 International Symposium on Knowledge Acquisition and Modeling (KAM)

Author(s): Yan Hao ; Diao Xing-chun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Wuhan, China
Conference Date: 21 December 2008
Page(s): 598 - 600
ISBN (Paper): 978-0-7695-3488-6
DOI: 10.1109/KAM.2008.113
Regular:

Considering the limited extensibility and the uneven capacity of the cleaning rule in current data cleaning work, this paper proposes an optimal cleaning rule selection model based on the machine... View More

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