IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Rough Set Based Hybrid Method to Feature Selection

2008 International Symposium on Knowledge Acquisition and Modeling (KAM)

Author(s): He Ming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Wuhan, China
Conference Date: 21 December 2008
Page(s): 585 - 588
ISBN (Paper): 978-0-7695-3488-6
DOI: 10.1109/KAM.2008.12
Regular:

Features selection is a process to find the optimal subset of features that satisfy certain criteria. The aim of feature selection is to remove unnecessary features to the target concept. This... View More

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