IEEE - Institute of Electrical and Electronics Engineers, Inc. - Intrusion Detection Based on Minimax Probability Machine with Immune Clonal Feature Optimized

2008 International Symposium on Knowledge Acquisition and Modeling (KAM)

Author(s): Zhenguo Chen ; Dongyan Li ; Hongde Ren
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Wuhan, China
Conference Date: 21 December 2008
Page(s): 329 - 332
ISBN (Paper): 978-0-7695-3488-6
DOI: 10.1109/KAM.2008.86
Regular:

This paper synthetically applied immune clonal feature optimized method and minimax probability machine to the intrusion detection. Minimax probability machines (MPMs) is a state-of-the-art... View More

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