IEEE - Institute of Electrical and Electronics Engineers, Inc. - Traffic Accident Cause Analysis Method Based on Knowledge Acquisition Model

2008 International Symposium on Knowledge Acquisition and Modeling (KAM)

Author(s): Yin Zhu ; Junli Wang ; Huapu Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Wuhan, China
Conference Date: 21 December 2008
Page(s): 131 - 135
ISBN (Paper): 978-0-7695-3488-6
DOI: 10.1109/KAM.2008.165
Regular:

This paper presents the knowledge acquisition model of traffic accident cause analysis method from the point of structured information. Moreover, this paper introduces the modified knowledge... View More

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