IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Robust Method of Singular Point Detection from Fingerprint

2008 International Symposium on Information Science and Engineering (ISISE)

Author(s): Yilong Yin ; Dawei Weng ; Hao Li ; Wenji Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Shanghai, China
Conference Date: 20 December 2008
Volume: 2
Page(s): 330 - 334
ISBN (Paper): 978-1-4244-2727-4
DOI: 10.1109/ISISE.2008.24
Regular:

To extract singular points from low quality fingerprint image, a two-phase algorithm for singular points extracting is presented in this paper. In the first phase, an improved Poincare index is... View More

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