IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Application of Wavelet in the Short-Term Flicker Severity Calculation

2008 International Symposium on Information Science and Engineering (ISISE)

Author(s): Rui Zhang ; Jin-Feng Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Shanghai, China
Conference Date: 20 December 2008
Volume: 1
Page(s): 511 - 514
ISBN (Paper): 978-1-4244-2727-4
DOI: 10.1109/ISISE.2008.289
Regular:

The short term flicker severity Pst is an important index of power quality in the standards of IEC. Usually Discrete Fourier Transform (DFT) is used to calculate Pst, due to... View More

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