IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of Negative Association Rules in Multi-database

2008 International Symposium on Information Science and Engineering (ISISE)

Author(s): Xiangjun Dong ; Shiju Shang ; Jie Li ; He Jiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Shanghai, China
Conference Date: 20 December 2008
Volume: 1
Page(s): 460 - 463
ISBN (Paper): 978-1-4244-2727-4
DOI: 10.1109/ISISE.2008.262
Regular:

The increasing use of multi-database technology has led to the development of many multi-database systems for real-world application. Large companies may have to confront the multiple data-source... View More

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