IEEE - Institute of Electrical and Electronics Engineers, Inc. - Aliasing Probability in Multiple Input Signature Registers under Q-ary Symmetric Errors Model

2008 International Symposium on Information Science and Engineering (ISISE)

Author(s): Zheng Wenrong ; Wang Shuzong ; Ye Huijuan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Shanghai, China
Conference Date: 20 December 2008
Volume: 1
Page(s): 397 - 400
ISBN (Paper): 978-1-4244-2727-4
DOI: 10.1109/ISISE.2008.268
Regular:

The aliasing probability in single and multiple input Linear Automata Signature Registers has been widely studied under the independent bit error model. This paper examines aliasing in a class of... View More

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