IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fabric Defect Detection Based on Wavelet Decomposition with One Resolution Level

2008 International Symposium on Information Science and Engineering (ISISE)

Author(s): Shengqi Guan ; Xiuhua Shi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Shanghai, China
Conference Date: 20 December 2008
Volume: 1
Page(s): 281 - 285
ISBN (Paper): 978-1-4244-2727-4
DOI: 10.1109/ISISE.2008.139
Regular:

According to the property of wavelet transform and fabric texture's Fourier spectrum, a new method for defect detection was presented. The proposed method is based on wavelet lifting transform... View More

Advertisement