IEEE - Institute of Electrical and Electronics Engineers, Inc. - RaceCheck: A race logic audit program for ESL-based soc designs

APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

Author(s): T. Chan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Macao, China
Conference Date: 30 November 2008
Page(s): 1,268 - 1,271
ISBN (Paper): 978-1-4244-2341-5
ISBN (Online): 978-1-4244-2342-2
DOI: 10.1109/APCCAS.2008.4746258
Regular:

This paper describes a new version of RaceCheck, an advanced static and dynamic race logic analysis program, that can audit a new type of race logic arises from the use of inter-process... View More

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