IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new statistical timing analyzer propagating delay and slew distributions simultaneously

APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

Author(s): S. Takahashi ; S. Tsukiyama
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Macao, China
Conference Date: 30 November 2008
Page(s): 352 - 355
ISBN (Paper): 978-1-4244-2341-5
ISBN (Online): 978-1-4244-2342-2
DOI: 10.1109/APCCAS.2008.4746032
Regular:

Due to the progress of nanometer process technologies, variability of circuit parameters is increasing and the statistical static timing analysis (S-STA) has been studied intensively. The existing... View More

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