IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration

APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

Author(s): Wen-Yi Chen ; Ming-Dou Ker ; Yeh-Jen Huang ; Yeh-Ning Jou ; Geeng-Lih Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Macao, China
Conference Date: 30 November 2008
Page(s): 61 - 64
ISBN (Paper): 978-1-4244-2341-5
ISBN (Online): 978-1-4244-2342-2
DOI: 10.1109/APCCAS.2008.4745960
Regular:

In high voltage (HV) ICs, the latch-up immunity of HV devices is often referred to the TLP-measured holding voltage because the huge power generated from DC curve tracer can easily damage HV... View More

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