IEEE - Institute of Electrical and Electronics Engineers, Inc. - Error rate performance of MC DS-CDMA systems over multiple-input-multiple-output Nakagami-m fading channel

MILCOM 2008 - 2008 IEEE Military Communications Conference

Author(s): S.M. Elnoubi ; A.-A. Hashem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: San Diego, CA, USA
Conference Date: 16 November 2008
Page(s): 1 - 7
ISBN (CD): 978-1-4244-2677-5
ISBN (Paper): 978-1-4244-2676-8
DOI: 10.1109/MILCOM.2008.4753225
Regular:

In this paper, we present a study for the error rate performance of multi carrier direct sequence code division multiple access (MC DS-CDMA) system in conjunction with maximum ratio combining... View More

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