IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling the cost of poor quality

2008 Winter Simulation Conference (WSC)

Author(s): Claudia Barbara ; Edmundo Eutropio ; C. de Souza ; Rosangela Catunda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Miami, FL, USA, USA
Conference Date: 7 December 2008
Page(s): 1,437 - 1,441
ISBN (CD): 978-1-4244-2708-6
ISBN (Paper): 978-1-4244-2707-9
ISSN (Electronic): 1558-4305
ISSN (Paper): 0891-7736
DOI: 10.1109/WSC.2008.4736221
Regular:

The paper presents the Oi experience on the implementation, through simulations, of a model for reducing non quality process costs of three categories: non-conformance issues, service failures and... View More

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