IEEE - Institute of Electrical and Electronics Engineers, Inc. - Benefits of concurrent spatial and spectral analysis of photonic components

2008 IEEE 20th International Conference on Indium Phosphide & Related Materials (IPRM)

Author(s): Y. Bottesman ; A. Parini ; B.-E. Benkelfat ; E.V.K. Rao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Versailles, France
Conference Date: 25 May 2008
Page(s): 1 - 3
ISBN (CD): 978-1-4244-2259-3
ISBN (Paper): 978-1-4244-2258-6
ISSN (Paper): 1092-8669
DOI: 10.1109/ICIPRM.2008.4702997
Regular:

This paper highlights the decisive advantages offered by concurrent spatial and spectral analysis (SSA) of photonic components to acquire an insightful assessment of their properties. Herein, two... View More

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