IEEE - Institute of Electrical and Electronics Engineers, Inc. - Will Test Compression Run Out of Gas?

2008 IEEE International Test Conference

Author(s): S.K. Goel ; E.J. Marinissen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Santa Clara, CA, USA
Conference Date: 28 October 2008
Page(s): 1
ISBN (CD): 978-1-4244-2403-0
ISBN (Paper): 978-1-4244-2402-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2008.4700666
Regular:

This panel addresses the question if test data compression was only a temporary fix, or a truly future-proof solution. Interoperability, low-power test, high-volume diagnosis, digital vs. analog... View More

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