IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling Information Quality Risk in Data Mining

2008 4th International Conference on Wireless Communications, Networking and Mobile Computing (WiCOM)

Author(s): Ying Su ; Donghong Li ; Jie Peng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Dalian, China
Conference Date: 12 October 2008
Page(s): 1 - 4
ISBN (CD): 978-1-4244-2108-4
ISBN (Paper): 978-1-4244-2107-7
DOI: 10.1109/WiCom.2008.2424
Regular:

Information quality (IQ) is a critical factor in the success of the data mining (DM). Therefore, it is essential to measure the risk of IQ in a data warehouse to ensure success in implementing DM.... View More

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