IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Relationship between Organizational Career Management and Job Satisfaction: An Empirical Study on Software R&D Professionals

2008 International Conference on Risk Management & Engineering Management

Author(s): Wu Wenhua
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Beijing, China
Conference Date: 4 November 2008
Page(s): 593 - 598
ISBN (Paper): 978-0-7695-3402-2
DOI: 10.1109/ICRMEM.2008.61
Regular:

The primary purpose of this paper is to explore the relationship between organizational career management (OCM) and job satisfaction (JS). The measurements we used were the OCM scale developed by... View More

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