IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliable system design: Models, metrics and design techniques

2008 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

Author(s): Subhasish Mitra ; Ravishankar K. Iyer ; Kishor Trivedi ; James W. Tschanz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: San Jose, CA, USA
Conference Date: 10 November 2008
ISBN (CD): 978-1-4244-2820-5
ISBN (Paper): 978-1-4244-2819-9
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2008.4681534
Regular:

Design of reliable systems meeting stringent quality, reliability, and availability requirements is becoming increasingly difficult in advanced technologies. The current design paradigm, which... View More

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