IEEE - Institute of Electrical and Electronics Engineers, Inc. - Visual analysis of seismic simulation data

2008 IEEE Symposium on Visual Analytics Science and Technology (VAST)

Author(s): F.J. Gerhardt ; J. Meyer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Columbus, OH, USA
Conference Date: 19 October 2008
Page(s): 191 - 192
ISBN (Paper): 978-1-4244-2935-6
DOI: 10.1109/VAST.2008.4677381
Regular:

Seismic simulations use finite element methods to describe ground motion. The results of such numerical simulations are often difficult to interpret for decision makers. We describe a terrain... View More

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