IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced Approaches in Defect Detection and Prevention Strategies in Small and Medium Scale Industries

2008 The Third International Conference on Software Engineering Advances (ICSEA)

Author(s): V. Suma ; T. Nair
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Sliema, Malta
Conference Date: 26 October 2008
Page(s): 389 - 393
ISBN (CD): 978-0-7695-3372-8
ISBN (Paper): 978-1-4244-3218-9
DOI: 10.1109/ICSEA.2008.79
Regular:

Advancement in fundamental engineering aspects of software development enables IT enterprises to develop a more cost effective and better quality product through aptly organized defect detection... View More

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