IEEE - Institute of Electrical and Electronics Engineers, Inc. - Level set segmentation with outlier rejection

2008 15th IEEE International Conference on Image Processing - ICIP 2008

Author(s): M. Silveira ; J.C. Nascimento ; J.S. Marques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: San Diego, CA, USA
Conference Date: 12 October 2008
Page(s): 1,085 - 1,088
ISBN (CD): 978-1-4244-1764-3
ISBN (Paper): 978-1-4244-1765-0
ISSN (Paper): 1522-4880
DOI: 10.1109/ICIP.2008.4711947
Regular:

Geometric active contours based on edges perform poorly in the presence of noise or clutter. When the edges have gaps or are indistinct, the contour leaks through the boundary. Furthermore, when... View More

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