IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dark line detection with line width extraction

2008 15th IEEE International Conference on Image Processing - ICIP 2008

Author(s): Q. Li ; L. Zhang ; J. You ; D. Zhang ; P. Bhattacharya
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: San Diego, CA, USA
Conference Date: 12 October 2008
Page(s): 621 - 624
ISBN (CD): 978-1-4244-1764-3
ISBN (Paper): 978-1-4244-1765-0
ISSN (Electronic): 2381-8549
ISSN (Paper): 1522-4880
DOI: 10.1109/ICIP.2008.4711831
Regular:

Automated line detection is a classical image processing topic with many applications such as road detection in remote images and vessel detection in medical images. Many traditional line... View More

Advertisement