IEEE - Institute of Electrical and Electronics Engineers, Inc. - Confidence Intervals for Reliability From Stress-Strength Relationships

Author(s): Kuang Fu Cheng ; Anne Chao
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1984
Volume: R-33
Page(s): 246 - 249
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1984.5221803
Regular:

A new distribution-free procedure obtains s-confidence intervals for the reliability in the stress-strength model. Based on the coverage probability and average-length criteria, a simulation study... View More

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