IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical Procedures for Determining Electronic Part Design Margin Breakpoints

Author(s): David M. Clement
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1984
Volume: 31
Page(s): 1,423 - 1,426
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1984.4333523
Regular:

This note presents a set of statistical procedures for accepting or rejecting part types on the basis of lot sample tests-to failure or parameter degradation tests of parts subject to... View More

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