IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inspirations from U.S. subprime lending crisis to credit risk management of Chinese commercial banks

2008 IEEE International Conference on Service Operations and Logistics, and Informatics (SOLI)

Author(s): Bi Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Beijing, China
Conference Date: 12 October 2008
Volume: 1
Page(s): 465 - 471
ISBN (CD): 978-1-4244-2013-1
ISBN (Paper): 978-1-4244-2012-4
DOI: 10.1109/SOLI.2008.4686440
Regular:

Under analyzing the causes and impacts of U.S. subprime lending crisis, the article pointed that it brings some inspirations for strengthening credit risk management of Chinese banking industry.... View More

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