IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hierarchically linked extended features in fingerprints

2008 Biometrics Symposium (BSYM)

Author(s): K. Mieloch ; A. Munk ; P. Mihailescu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Tampa, FL, USA
Conference Date: 23 September 2008
Page(s): 47 - 52
ISBN (CD): 978-1-4244-2567-9
ISBN (Paper): 978-1-4244-2566-2
DOI: 10.1109/BSYM.2008.4655522
Regular:

Requirements for identifying and defining additional fingerprint features beyond minutiae, even not limited to level 3 details, has already been addressed by the community . However, new feature... View More

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