IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scars, marks and tattoos (SMT): Soft biometric for suspect and victim identification

2008 Biometrics Symposium (BSYM)

Author(s): Jung-Eun Lee ; A.K. Jain ; Rong Jin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Tampa, FL, USA
Conference Date: 23 September 2008
Page(s): 1 - 8
ISBN (CD): 978-1-4244-2567-9
ISBN (Paper): 978-1-4244-2566-2
DOI: 10.1109/BSYM.2008.4655515
Regular:

Scars, marks and tattoos (SMT) are being increasingly used for suspect and victim identification in forensics and law enforcement agencies. Tattoos, in particular, are getting serious attention... View More

Advertisement