IEEE - Institute of Electrical and Electronics Engineers, Inc. - CT saturation calculations - are they applicable in the modern world? - Part III, low-ratio, high-current CT/microprocessor relay comparisons at a high-current testing laboratory

2008 IEEE Petroleum and Chemical Industry Technical Conference (PCIC 2008)

Author(s): R.E. Cosse ; D.G. Dunn ; R.M. Spiewak ; J.E. Bowen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Cincinnati, OH, USA
Conference Date: 22 September 2008
Page(s): 1 - 14
ISBN (CD): 978-1-4244-2521-1
ISBN (Paper): 978-1-4244-2520-4
ISSN (Paper): 0090-3507
DOI: 10.1109/PCICON.2008.4663966
Regular:

Part III is an extension of the Part II testing effort, but with relay manufacturers providing, commissioning, and configuring the relays for the high-current test laboratory activities. Part III... View More

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