IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced nonlinear inverse scattering through linear super-resolution techniques

2008 IEEE International Workshop on Imaging Systems and Techniques

Author(s): G. Bozza ; C. Estatico ; J.G. Nagy ; M. Pastorino ; A. Randazzo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Crete, Greece
Conference Date: 10 September 2008
Page(s): 227 - 231
ISBN (CD): 978-1-4244-2497-9
ISBN (Paper): 978-1-4244-2496-2
ISSN (Paper): 1558-2809
DOI: 10.1109/IST.2008.4659974
Regular:

In microwave inverse scattering, the dielectric properties of an object are retrieved starting from the knowledge of samples of the electromagnetic field it scatters. The mathematical model of the... View More

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