IEEE - Institute of Electrical and Electronics Engineers, Inc. - A linear sampling approach to crack detection in microwave imaging

2008 IEEE International Workshop on Imaging Systems and Techniques

Author(s): G. Bozza ; M. Brignone ; M. Pastorino ; M. Piana ; A. Randazzo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Crete, Greece
Conference Date: 10 September 2008
Page(s): 222 - 226
ISBN (CD): 978-1-4244-2497-9
ISBN (Paper): 978-1-4244-2496-2
ISSN (Paper): 1558-2809
DOI: 10.1109/IST.2008.4659973
Regular:

In this contribution a new approach for inspecting crack and defects in known structures by using microwaves is presented. The novelty consists in using a new formulation of the linear sampling... View More

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