IEEE - Institute of Electrical and Electronics Engineers, Inc. - New methodologies for eliminating No Trouble Found, No Fault Found and other non repeatable failures in depot settings

IEEE AUTOTESTCON 2008

Author(s): M. Santoro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Salt Lake City, UT, USA
Conference Date: 8 September 2008
Page(s): 336 - 340
ISBN (CD): 978-1-4244-2226-5
ISBN (Paper): 978-1-4244-2225-8
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2008.4662636
Regular:

New methodologies for eliminating No Trouble Found (NTF), No Fault Found (NFF) and other non repeatable failures in depot (or other) repair settings. Trying to find NTFs or NFFs has been as... View More

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