IEEE - Institute of Electrical and Electronics Engineers, Inc. - Risk factors that affect collaborative software development

2008 IEEE International Conference on Management of Innovation & Technology (ICMIT 2008)

Author(s): M.K. Nayak ; P. Suesaowaluk
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Bangkok, Thailand
Conference Date: 21 September 2008
Page(s): 1,366 - 1,371
ISBN (CD): 978-1-4244-2330-9
ISBN (Paper): 978-1-4244-2329-3
DOI: 10.1109/ICMIT.2008.4654570
Regular:

This paper explores the concept of collaborative software development which involves multiple corporate units, often spanning national, linguistic, and cultural boundaries. This raises new... View More

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