IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test suite reduction analysis with enhanced tie-breaking techniques

2008 IEEE International Conference on Management of Innovation & Technology (ICMIT 2008)

Author(s): Jun-Wei Lin ; Chin-Yu Huang ; Chu-Ti Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Bangkok, Thailand
Conference Date: 21 September 2008
Page(s): 1,228 - 1,233
ISBN (CD): 978-1-4244-2330-9
ISBN (Paper): 978-1-4244-2329-3
DOI: 10.1109/ICMIT.2008.4654545
Regular:

Test suite minimization techniques try to remove redundant test cases of a test suite. However, reducing the size of a test suite might reduce its ability to reveal faults. Most of prior works... View More

Advertisement