IEEE - Institute of Electrical and Electronics Engineers, Inc. - Toward the next generation’s patent analysis: Patent database and public information

2008 IEEE International Conference on Management of Innovation & Technology (ICMIT 2008)

Author(s): Y.R. Li ; C.T. Chang ; M.Y. Chiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Bangkok, Thailand
Conference Date: 21 September 2008
Page(s): 1,141 - 1,146
ISBN (CD): 978-1-4244-2330-9
ISBN (Paper): 978-1-4244-2329-3
DOI: 10.1109/ICMIT.2008.4654530
Regular:

Patent is an important task for further development of contemporary knowledge management. This paper discusses the loss and challenges of patent management in variety and then discourses on the... View More

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